| dc.creator |
Leseduarte Cuevas, Sergio |
|
| dc.creator |
Marco Colás, Santiago |
|
| dc.creator |
Beyne, Eric |
|
| dc.creator |
Van Hoof, Rita |
|
| dc.creator |
Marty, Antoine |
|
| dc.creator |
Pinel, Stèphane |
|
| dc.creator |
Vendier, Olivier |
|
| dc.creator |
Coello-Vera, Augustín |
|
| dc.date |
2009-06-17T09:09:54Z |
|
| dc.date |
2009-06-17T09:09:54Z |
|
| dc.date |
2000 |
|
| dc.date.accessioned |
2024-12-16T10:18:15Z |
|
| dc.date.available |
2024-12-16T10:18:15Z |
|
| dc.identifier |
1521-3331 |
|
| dc.identifier |
http://hdl.handle.net/2445/8692 |
|
| dc.identifier |
154101 |
|
| dc.identifier.uri |
http://fima-docencia.ub.edu:8080/xmlui/handle/123456789/7357 |
|
| dc.description |
A new technology for the three-dimensional (3-D) stacking of very thin chips on a substrate is currently under development within the ultrathin chip stacking (UTCS) Esprit Project 24910. In this work, we present the first-level UTCS structure and the analysis of the thermomechanical stresses produced by the manufacturing process. Chips are thinned up to 10 or 15 m. We discuss potentially critical points at the edges of the chips, the suppression of delamination problems of the peripheral dielectric matrix and produce a comparative study of several technological choices for the design of metallic interconnect structures. The purpose of these calculations is to give inputs for the definition of design rules for this technology. We have therefore undertaken a programme that analyzes the influence of sundry design parameters and alternative development options. Numerical analyses are based on the finite element method. |
|
| dc.format |
7 p. |
|
| dc.format |
application/pdf |
|
| dc.language |
eng |
|
| dc.publisher |
IEEE |
|
| dc.relation |
Reproducció del document publicat a http://dx.doi.org/10.1109/6144.888852 |
|
| dc.relation |
IEEE Transactions on Components Packaging and Manufacturing Technology Part A, 2000, vol. 23, núm. 4, p. 673-679. |
|
| dc.relation |
http://dx.doi.org/10.1109/6144.888852 |
|
| dc.rights |
(c) IEEE, 2000 |
|
| dc.rights |
info:eu-repo/semantics/openAccess |
|
| dc.source |
Articles publicats en revistes (Enginyeria Electrònica i Biomèdica) |
|
| dc.subject |
Delamination |
|
| dc.subject |
Finite element analysis |
|
| dc.subject |
Integrated circuit design |
|
| dc.subject |
Integrated circuit interconnections |
|
| dc.subject |
Integrated circuit packaging |
|
| dc.subject |
Thermal stresses |
|
| dc.subject |
Circuits integrals |
|
| dc.title |
Residual thermomechanical stresses in thinned-chip assemblies |
|
| dc.type |
info:eu-repo/semantics/article |
|
| dc.type |
info:eu-repo/semantics/publishedVersion |
|