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Effect of the nanoparticles on the structure and crystallization of amorphous silicon thin films produced by rf glow discharge

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dc.creator Bertrán Serra, Enric
dc.creator Sharma, S. N.
dc.creator Viera Mármol, Gregorio
dc.creator Costa i Balanzat, Josep
dc.creator St'ahel, P.
dc.creator Roca i Cabarrocas, P. (Pere)
dc.date 2011-05-25T10:54:17Z
dc.date 2011-05-25T10:54:17Z
dc.date 1998
dc.date.accessioned 2024-12-16T10:27:08Z
dc.date.available 2024-12-16T10:27:08Z
dc.identifier 0884-2914
dc.identifier http://hdl.handle.net/2445/18204
dc.identifier 165136
dc.identifier.uri http://fima-docencia.ub.edu:8080/xmlui/handle/123456789/21923
dc.description Thin films of nanostructured silicon (ns-Si:H) were deposited by plasma-enhanced chemical vapor deposition in the presence of silicon nanoparticles at 100 C substrate temperature using silane and hydrogen gas mixture under continuous wave (cw) plasma conditions. The nanostructure of the films has been demonstrated by diverse ways: transmission electron microscopy, Raman spectroscopy and x-ray diffraction, which have shown the presence of ordered silicon clusters (1!=2 nm) embedded in an amorphous silicon matrix. Due to the presence of these ordered domains, the films crystallize faster than standard hydrogenated amorphous silicon samples, as evidenced by electrical measurements during the thermal annealing.
dc.format 4 p.
dc.format application/pdf
dc.language eng
dc.publisher Materials Research Society
dc.relation Reproducció del document publicat a http://dx.doi.org/10.1557/JMR.1998.0347
dc.relation Journal of Materials Research, 1998, vol. 13, núm. 9, p. 2476-2479
dc.relation http://dx.doi.org/10.1557/JMR.1998.0347
dc.rights (c) Materials Research Society, 1998
dc.rights info:eu-repo/semantics/openAccess
dc.source Articles publicats en revistes (Física Aplicada)
dc.subject Pel·lícules fines
dc.subject Nanopartícules
dc.subject Silici
dc.subject Cristal·lització
dc.subject Thin films
dc.subject Nanoparticles
dc.subject Silicon
dc.subject Cristallization
dc.title Effect of the nanoparticles on the structure and crystallization of amorphous silicon thin films produced by rf glow discharge
dc.type info:eu-repo/semantics/article
dc.type info:eu-repo/semantics/publishedVersion


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