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Structural characterization of GaN nanowires using TEM

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dc.contributor Martín, Gemma
dc.contributor Peiró Martínez, Francisca
dc.creator Pozo Bueno, Daniel del
dc.date 2018-09-13T15:16:35Z
dc.date 2018-09-13T15:16:35Z
dc.date 2018-01
dc.date.accessioned 2024-12-16T10:26:39Z
dc.date.available 2024-12-16T10:26:39Z
dc.identifier http://hdl.handle.net/2445/124533
dc.identifier.uri http://fima-docencia.ub.edu:8080/xmlui/handle/123456789/21400
dc.description Treballs Finals de Grau de Física, Facultat de Física, Universitat de Barcelona, Curs: 2018, Tutores: Gemma Martín, Francesca Peiro
dc.description In the present study, gallium nitride (GaN) nanowires fabricated by top-down etching are investigated by transmission electron microscopy (TEM). The study starts with the lamella preparation using the lift-out technique in a focused ion beam (FIB) instrument. Subsequently, different observation modes of the TEM are applied to asses the quality of the growth and identify the crystal structure. Selected area diffraction mode (SAD) is used to obtain the diffraction patterns, which are appropriate to identify the crystal structure. Then, two-beam conditions are carried out to find the crystallographic defects and, Finally, through the high resolution mode, the phase contrast images are used to achieve atomic resolution.
dc.format 5 p.
dc.format application/pdf
dc.language eng
dc.rights cc-by-nc-nd (c) del Pozo, 2018
dc.rights http://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.rights info:eu-repo/semantics/openAccess
dc.source Treballs Finals de Grau (TFG) - Física
dc.subject Nitrur de gal·li
dc.subject Microscòpia electrònica de transmissió
dc.subject Treballs de fi de grau
dc.subject Gallium nitride
dc.subject Transmission electron microscopy
dc.subject Bachelor's theses
dc.title Structural characterization of GaN nanowires using TEM
dc.type info:eu-repo/semantics/bachelorThesis


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