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Characterization of semiconductor detectors for [gamma]-ray and x-ray spectrometry

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dc.contributor Fernández Varea, José María
dc.creator Boyer López, Helena
dc.date 2017-09-06T14:23:58Z
dc.date 2017-09-06T14:23:58Z
dc.date 2017-01
dc.date.accessioned 2024-12-16T10:25:12Z
dc.date.available 2024-12-16T10:25:12Z
dc.identifier http://hdl.handle.net/2445/115049
dc.identifier.uri http://fima-docencia.ub.edu:8080/xmlui/handle/123456789/19018
dc.description Treballs Finals de Grau de Física, Facultat de Física, Universitat de Barcelona, Curs: 2017, Tutor: José M. Fernández-Varea
dc.description Semiconductor detectors are routinely used in [gamma]-ray and x-ray spectrometry. Their characteriza- tion is crucial in order to perform quantitative analysis. Three steps are needed to this end: energy and FWHM calibration and determination of the full-energy peak effciency. In this TFG we have performed these steps for a HPGe detector. We confirmed the very high linearity, excellent energy resolution and high effciency of the studied spectrometer.
dc.format 5 p.
dc.format application/pdf
dc.language eng
dc.rights cc-by-nc-nd (c) Boyer, 2017
dc.rights http://creativecommons.org/licenses/by-nc-nd/3.0/es/
dc.rights info:eu-repo/semantics/openAccess
dc.source Treballs Finals de Grau (TFG) - Física
dc.subject Detectors de radiació
dc.subject Semiconductors
dc.subject Treballs de fi de grau
dc.subject Nuclear counters
dc.subject Semiconductors
dc.subject Bachelor's theses
dc.title Characterization of semiconductor detectors for [gamma]-ray and x-ray spectrometry
dc.type info:eu-repo/semantics/bachelorThesis


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