| dc.contributor |
Estradé Albiol, Sònia |
|
| dc.contributor |
Coll Benejam, Catalina |
|
| dc.creator |
Bastons García, Joan Carles |
|
| dc.date |
2016-03-08T16:44:17Z |
|
| dc.date |
2016-03-08T16:44:17Z |
|
| dc.date |
2016-01 |
|
| dc.date.accessioned |
2024-12-16T10:22:06Z |
|
| dc.date.available |
2024-12-16T10:22:06Z |
|
| dc.identifier |
http://hdl.handle.net/2445/96259 |
|
| dc.identifier.uri |
http://fima-docencia.ub.edu:8080/xmlui/handle/123456789/13765 |
|
| dc.description |
Treballs Finals de Grau de Física, Facultat de Física, Universitat de Barcelona, Curs: 2016, Tutores: Sònia Estradé Albiol and Catalina Coll Benejam |
|
| dc.description |
Lanthanum nickel oxide, LaNiO3, is often used as an electrode in many electronic
devices due to its low resistivity. The study of its properties requires understanding them in the
nanoscale and, for this purpose, the electron transmission microscope is an indispensable tool. In
the present work, we aim to examine the defects observed in High Angular Annular Dark Field
(HAADF) images of a lanthanum nickel oxide thin film grown epitaxially on a lanthanum aluminate
substrate. For this end, High Resolution Transmission Electron Microscopy (HRTEM) and HAADF
images are simulated following the multislice method, implemented by Temsim, a software provided
freely by E.J. Kirkland. Results show that the multislice method is a powerful tool so as to interpret the defects in the structure |
|
| dc.format |
5 p. |
|
| dc.format |
application/pdf |
|
| dc.language |
eng |
|
| dc.rights |
cc-by-nc-nd (c) Bastons, 2016 |
|
| dc.rights |
http://creativecommons.org/licenses/by-nc-nd/3.0/es/ |
|
| dc.rights |
info:eu-repo/semantics/openAccess |
|
| dc.source |
Treballs Finals de Grau (TFG) - Física |
|
| dc.subject |
Lantani |
|
| dc.subject |
Defectes cristal·lins |
|
| dc.subject |
Treballs de fi de grau |
|
| dc.subject |
Simulació per ordinador |
|
| dc.subject |
Lanthanum |
|
| dc.subject |
Crystals defects |
|
| dc.subject |
Bachelor's theses |
|
| dc.subject |
Computer simulation |
|
| dc.title |
Characterization of crystallographic defects in LaNiO3 through TEM image simulations |
|
| dc.type |
info:eu-repo/semantics/bachelorThesis |
|